翻译求助于高手-----

哪位高人指点一下,请问下面报告的意思,不胜感激!!!
Verification Summary

Bench Test:
Both unit not able to communicate on EVB due to unit has been secured.

ATE Test:
Attempt and successfully unsecure both unit on ATE. However, both unit fails open/short test when perform unsecure test.
Unit#1 : fails open on PM4 (pin 71).
Unit#2 : fails open on PAD03 (pin 54).
Both units proceed with full QC ATE flow and confirm the same failure.

Futher Bench Test:
Unpowered Curve trace on both units found:
Unit#1 : Resistive short/open on pin71.
Unit#2 : open on pin 54.

Analysis with the use of Signature Failure Analysis, it has been determined that the root cause of this device is due to electrical overstress.