求翻译成中文，谢谢~很急~
it was found out that a discrepancy on ATE handler setting and prober setting
caused an offset on wafer map retest result wherein site1 was tested but site2
bin outcome was updated and reflected on the final wafer map.
谢谢~
caused an offset on wafer map retest result wherein site1 was tested but site2
bin outcome was updated and reflected on the final wafer map.
谢谢~
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danaus (威望:0) -
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ATE系统和探测器设定的差异导致晶圆图的偏移,造成site1位置进行再测定，site2位置却在最终晶圆图上被更新和重新反映。