ict測試原理

TR-8001
類比測試原理
Test Research, Inc.
October, 2002
TR-8001 C-1 類比測試原理 (Ver.1.0) 2/20
Better Testing Better Quality ©Test Research, Inc.
C-1 類比元件測試原理......................................................................................... 3
C-1-1 Open / Short 測試原理........................................................................ 3
C-1-1-1 為什麼使用短路群(Short Group) .............................................. 3
C-1-1-2 如何形成短路群........................................................................ 4
C-1-1-3 如何決定Raw THD 之值.......................................................... 5
C-1-1-4 短路測試原理........................................................................... 5
C-1-1-5 OPI 與SPI 測試........................................................................ 7
C-1-2 JUMPER 測試原理............................................................................. 8
C-1-2-1 模式0 (使用開路/短路(OPS)量測) ............................................ 8
C-1-2-2 模式1 (使用電阻量測) .............................................................. 8
C-1-2-3 模式2 (使用電阻量測) .............................................................. 9
C-1-3 電阻量測............................................................................................. 9
C-1-3-1 電阻測試原理............................................................................ 9
C-1-3-2 定電流源量測 MODE 0............................................................. 9
C-1-3-3 低電流之定電流源量測MODE 1............................................. 10
C-1-3-4 快速電阻測試MODE2............................................................ 10
C-1-4 電容量測............................................................................................11
C-1-4-1 電容測試原理...........................................................................11
C-1-4-2 AC Measure (MODE 0,1,2,3) ................................................. 13
C-1-4-3 CX // RX (MODE 5,6,7) .......................................................... 13
C-1-4-4 DC Constant Current test MODE4, MODE8 .......................... 14
C-1-5 電感量測........................................................................................... 15
C-1-5-1 電感量測原理.......................................................................... 15
C-1-5-2 AC Measure (MODE 0,1,2,3) ................................................. 16
C-1-5-3 Lx // Rx (MODE 5,6,7)............................................................ 17
C-1-6 電晶體量測Measurement of Transistor............................................ 17
C-1-6-1 VCE 量測Measurement of VCE (MODE3, 4) .......................... 18
C-1-6-2 hfe 量測(MODE12, 13) ............................................................ 18
C-1-7 FET 量測(MODE14, 15) ................................................................... 18
C-1-8 IC Clamping Diode 量測................................................................... 18
C-1-8-1 Clamping Diode 測試原理...................................................... 18
C-1-9 Agilent 測試技術............................................................................... 19
C-1-9-1 Agilent TestJet 測試原理......................................................... 19
TR-8001 C-1 類比測試原理 (Ver.1.0) 3/20
Better Testing Better Quality ©Test Research, Inc.
C-1 類比元件測試原理
C-1-1 Open / Short 測試原理
由㆖圖所示，其RX 是為待測物，由系統送出0.2V，內阻為20 OHM 之
訊號，再用電壓表量測待測兩端之電壓，而待測物的阻值可經由㆘列公式
反求之。
我們令待測物之電阻為RX，待測物㆖之電壓為VRX，所以待測物之電阻
計算如㆘列公式所示：
RX
RX
X V
V R
−
×
=
2 . 0
20
故由㆖述之簡單公式我們可以輕易的判斷出待測物之電阻值。
㆘圖為待測物電阻值與其待測物電壓值之關係。
Open/Short Test
0.000
0.020
0.040
0.060
0.080
0.100
0.120
0.140
0.160
0.180
0 20 40 60 80 100
待測物電阻值
待
測
物
電
壓
值

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